This abstract was written for the Environmental Monitoring and Forensics Conference on Wednesday 22 October at The Edge, Sheffield. The event is sponsored by two Knowledge Transfer Networks and a number of other organisations.
From Measuring Instruments to Virtual Measuring on Screen
The difficulty with measuring at nanoscale and below lies in not being able to see what is measured, when Coordinate Measuring Machines (CMM) are used. Microscopes cannot be used for measuring at nanoscale because their respective technology may invade the object or material to be magnified thus changing the characteristics and possibly distorting the specimen.
When measuring environmental conditions one, one encounters enormous complexity and amounts of data, besides the challenge of addressing short and long-term time intervals.
